"Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs ..."

Sehun Kook, Hyun Woo Choi, Abhijit Chatterjee (2013)

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DOI: 10.1109/TVLSI.2012.2190433

access: closed

type: Journal Article

metadata version: 2020-03-11

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Sehun Kook, Hyun Woo Choi, Abhijit Chatterjee:
Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements. IEEE Trans. Very Large Scale Integr. Syst. 21(3): 454-464 (2013)

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