"Hot-carrier degradation analysis based on ring oscillators."

Jingchao Wang, Edgar Olthof, Wim Metselaar (2006)

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DOI: 10.1016/J.MICROREL.2006.07.070

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jingchao Wang, Edgar Olthof, Wim Metselaar:
Hot-carrier degradation analysis based on ring oscillators. Microelectron. Reliab. 46(9-11): 1858-1863 (2006)

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