"Current Testing Procedure for Deep Submicron Devices."

Anton Chichkov, Dirk Merlier, Peter Cox (2001)

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DOI: 10.1023/A:1012255026714

access: closed

type: Journal Article

metadata version: 2020-09-11

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Anton Chichkov, Dirk Merlier, Peter Cox:
Current Testing Procedure for Deep Submicron Devices. J. Electron. Test. 17(3-4): 219-224 (2001)

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