"A high throughput test methodology for MCM substrates."

Bruce C. Kim, David C. Keezer, Abhijit Chatterjee (1998)

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DOI: 10.1109/TEST.1998.743157

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bruce C. Kim, David C. Keezer, Abhijit Chatterjee:
A high throughput test methodology for MCM substrates. ITC 1998: 234-240

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