Wafermap 3.20

Free Collects and edits semiconductor wafer data
3.4 
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3.20 See all
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Free   7.2 MB

WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.

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3.4
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R
rating Ryan
Thanks for sharing this software.

Feb 23, 2024 Was it helpful?  yes(0) no(0) | Reply
C
rating Christoph
Great visualization tool for ellipsometer data

Was it helpful?  yes(0) no(0) | Reply