A novel on-chip testability access architecture provides comprehensive tester-driven access to the Alpha 21264 microprocessor's testability features during ...

Testability access of the high speed test features in the Alpha 21264 microprocessor. In Proceedings IEEE International Test Conference 1998, Washington, DC ...

The architecture uses the IEEE Std 1149.1 to access all test features by creatively solving a number of problems in accessing the chip?s at-speed testability ...

Bibliographic details on Testability access of the high speed test features in the Alpha 21264 microprocessor.

The paper presents a pragmatic scan partitioning architecture that allows less than perfect scan design in high performance, VLSI circuits to cost-effectively ...

Testability access of the high speed test features in the Alpha 21264 microprocessor · Computer Science, Engineering. Proceedings International Test Conference ...

This paper describes the testability strategy and design-for-test features of the Alpha AXP 21164 microprocessor. It discusses the specific testability and ...

, “Testability Access of the High Speed Test Features in the Alpha. 21264 Microprocessor,” Int'l Test Conf., pp. 487-495, October 1998. Paper 30.2. 771. Page 9 ...

2024/04/25 · Testability access of the high speed test features in the Alpha 21264 microprocessor. ITC 1998: 487-495. [+][–]. Coauthor network. maximize.

This paper summarizes the testability features of the Alpha 21164 microprocessor chip and describes the design of the special test ports employed for accessing ...