The paper presents a pragmatic scan partitioning architecture that allows less than perfect scan design in high performance, VLSI circuits to cost-effectively ...

Testability features of the alpha 21364 microprocessor ... Published in: International Test Conference, 2003. Proceedings. ITC 2003. Article #:. Date of ...

Introduction. The Alpha 21364 [1] is the fourth generation. Alpha microprocessor. This 139 million transistor 1443-pin chip, originally a 0.18 µm.

Introduction. The Alpha 21364 [l] is the fourth generation. Alpha microprocessor. This 139 million transistor 1443-pin chip, originally a 0.18 pm.

The custom testability strategy of the Alpha 21364, Hewlett-Packard's most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core, ...

Testability Features of the Alpha 21364 Microprocessor. Conference Paper. Full-text available. Jan 2003.

Testability features of the alpha 21364 microprocessor · Clock calibration faults and their impact on quality of high performance microprocessors · An Effective ...

2024/04/25 · Scott Erlanger, Dilip K. Bhavsar, Richard A. Davies: Testability Features of the Alpha 21364 Microprocessor. ITC 2003: 764-772.

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ABSTRACT. This paper presents the strategy used to verify the error logic in the Alpha 21364 microprocessor. Traditional pre-silicon.