In this work, we describe, for different types of MEMS, how the required non-electrical test stimuli can be induced on-chip by means of electrical signals. This ...
We illustrate the ability to generate on-chip test stimuli and to implement a self-test strategy for the case of a complete application. This corresponds to an ...
In this work we describe, for three different types of MEMS that work in different energy domains, how the required nonelectrical test stimuli can be induced ...
Generation of Electrically Induced Stimuli for MEMS Self-Test. December 2001 · Journal of Electronic Testing. Benoit Charlot ...
Generation of electrically induced stimuli for MEMS self-test - Institut ...
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A major task for the implementation of built-in-self-test (BIST) strategies for MEMS is the generation of the test stimuli. These devices can work in ...
This work describes, for different types of MEMS, how the required non-electrical test stimuli can be induced on-chip by means of electrical signals, ...
A major task for the implementation of built-in-self-test (BIST) strategies for MEMS is the generation of the test stimuli. These devices can work in ...
Abstract. A major task for the implementation of Built-In-Self-Test (BIST) strategies for MEMS is the generation of the test stimuli.
In this work we describe, for three different types of MEMS that work in different energy domains, how the required non-electrical test stimuli can be induced ...
MEMS is the multi-domain nature of the sensing parts that require special test equipment for stimuli generation. In this work we describe, for three ...