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An interconnect test and diagnostic scheme based on distributed BIST resources in SOC and MCM designs is described. Test and diagnosis is enabled by embedd.
2004/06/01 · An interconnect test and diagnostic scheme based on distributed BIST resources in SOC and MCM designs is described. Test and diagnosis is ...
Abstract. An interconnect test and diagnostic scheme based on distributed BIST resources in SOC and MCM designs is described. Test and diagnosis is enabled ...
Distributed Diagnosis of Interconnections in SoC and MCM Designs. An interconnect test and diagnostic scheme based on distributed BIST resources in SOC and ...
An interconnect test and diagnostic scheme based on distributed BIST resources in SOC and MCM designs is described. Test and diagnosis is enabled by embedding ...
This paper describes three versions of a new design of a shift register latch that lend themselves to distributed self-test and delay test. The advantages of ...
Distributed Diagnosis of Interconnections in SoC and MCM Designs. 291-307. Electronic Edition (link) BibTeX · Sandeep Koranne: A Note on System-on-Chip Test ...
Distributed Diagnosis of Interconnections in SoC and MCM Designs · Computer Science, Engineering. Journal of electronic testing · 2004.
Mechanics of Materials · Materials Chemistry · Engineering Materials and Their Applications.