WWLP-22News1mon
Aehr Announces Initial FOX-XP Multi-wafer Test and Burn-in Production System Order from Major Gallium Nitride Power Semiconductor Supplier
The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a ...
Morningstar1mon
Aehr Test Systems Secures Initial $10 Million in Orders for Production Wafer-Level Burn-In of Advanced AI Processors
Gayn Erickson, President and CEO of Aehr Test Systems, commented, "We are excited that after successfully proving the wafer level test performance and throughput on our systems at our headquarters ...