An AFM is capable of making these measurements by determining the pressure between a probe and the sample. Typically, the probe has a pyramid tip that is 3 to 6 micrometers tall. To resolve an image, ...

Originally the AFM was used to image the topography of surfaces, but by modifying the tip it is possible to measure other quantities (for example, electric and magnetic properties, chemical potentials ...

The size of the tip and flexibility of the cantilever contribute to the high resolution of the image, which can reach 10 p.m. The operating modes of the AFM (contact, non-contact, and tapping) and ...

Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is slightly doped and the total resistance measured in contact to a platinium surface is < 10 ...